喷丸覆盖率对FGH95合金残余应力影响的FEM-DEM分析

FEM-DEM Coupling Analysis of the Effect of Shot Peening Coverage on Residual Stress in FGH95 Alloy CT Specimens

  • 摘要: 针对喷丸强化工艺中覆盖率对残余应力分布的影响规律,文章采用FEM-DEM(有限元-离散元)耦合方法,将喷丸工艺参数进行转化,构建出离散化冲击体系,对FGH95合金CT试件在100%、200%、300%和400%喷丸覆盖率下的残余应力进行数值模拟研究。结果表明:随着覆盖率提升,残余压应力幅值和分布均匀性显著增强,200%覆盖率时残余应力平均值较100%增加13.4%,方差降低35%,表明喷丸均匀性显著改善;覆盖率超过200%后,残余应力分布趋于饱和,平均应力增幅小于3.3%且方差稳定。此外,高覆盖率(400%)可使残余压应力层厚度扩展至0.63 mm,较100%覆盖率提升117%。研究揭示了喷丸覆盖率对残余应力幅值、均匀性及影响深度的调控机制,为优化喷丸工艺参数提供了理论依据。

     

    Abstract: To investigate the effect of shot peening coverage on residual stress distribution in shot peening strengthening, this study employs a FEM-DEM (finite element-discrete element method) coupling approach to transform shot peening process parameters and construct a discretized impact system. Numerical simulations of residual stress in compact tension (CT) specimens of FGH95 alloy under 100%, 200%, 300%, and 400% shot peening coverage were conducted. Results show that increasing coverage significantly enhances the amplitude and uniformity of residual compressive stress: at 200% coverage, the average residual stress increases by 13.4% and variance decreases by 35% compared to 100% coverage, indicating remarkable improvement in peening uniformity. Beyond 200% coverage, residual stress distribution tends to saturate, with the average stress increasing by less than 3.3% and variance stabilizing. Additionally, high coverage (400%) extends the thickness of the residual compressive stress layer to 0.63 mm, representing a 117% increase compared to 100% coverage. The study reveals the regulatory mechanism of shot peening coverage on residual stress amplitude, uniformity, and depth, providing a theoretical basis for optimizing shot peening process parameters.

     

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